Text ( visual ) : unmediated
2013 IEEE International Test Conference : (ITC 2013) : Anaheim, California, USA, 6-13 September 2013. -- Piscataway, N.J. : IEEE , c2013. -- xii, 497 p. : ill., ports. ; 27 cm. -- "IEEE Catalog Number: CFP13ITC-POD" ; Includes bibliographical references. -- ISBN 9781479908608 ; (BB15370387) ; https://ci.nii.ac.jp/ncid/BB15370387
Other Title(s): CFP13ITC-POD. -- Author Heading(s): International Test Conference ; Institute of Electrical and Electronics Engineers
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