Text ( visual ) : unmediated
2011 IEEE International Test Conference (ITC 2011) : Anaheim, California, USA, 20-22 September 2011. -- Piscataway, N.J. : IEEE , c2011. -- 508 p. : ill. ; 27 cm. -- IEEE Catalog Number: CFP11ITC-PRT ; Includes bibliographical references and index. -- ISBN 9781457701535 ; (BB09151458) ; https://ci.nii.ac.jp/ncid/BB09151458
Other Title(s): CFP11ITC-PRT. -- Author Heading(s): International Test Conference ; Institute of Electrical and Electronics Engineers
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