Text ( visual ) : unmediated
2008 17th Asian Test Symposium, Hokkaido, Japan 24-27 November 2008. -- Piscataway, N.J. : IEEE , c2008. -- xxiv, 392 p. : ill. ; 28 cm. -- "IEEE Catalog Number CFP08067-PRT"-- cover ; Includes bibliographical references and index. -- ISBN 9781424440030 ; (BA90540905) ; https://ci.nii.ac.jp/ncid/BA90540905
Other Title(s): Proceedings of the 17th Asian Test Symposium ; ATS. -- Author Heading(s): Asian Test Symposium
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