Text ( visual ) : unmediated
2008 IEEE International Test Conference (ITC) : Santa Clara, California, 28-30 October, 2008. -- Pages 1-534 ; Pages 535-1062. -- Piscataway, N.J. : Institute of Electrical and Electronics Engineers , c2008. -- 2 v. : ill. ; 28 cm. -- IEEE Catalog Number: CEP08ITC-PRT ; Includes bibliographical references and index. -- ISBN 9781424424023 ; 9781424424023 ; (BA89307051) ; https://ci.nii.ac.jp/ncid/BA89307051
Author Heading(s): Institute of Electrical and Electronics Engineers ; International Test Conference
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