Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

• • Hicks, John
• • De Forest, Peter R.
• • Baylor, Vivian M.
• • United States. National Institute of Standards and Technology
• • National Institute of Justice (U.S.)
• • Society of Photo-optical Instrumentation Engineers

• 関連文献: 1件

• • Hicks, John
• • De Forest, Peter R.
• • Baylor, Vivian M.
• • United States. National Institute of Standards and Technology
• • National Institute of Justice (U.S.)
• • Society of Photo-optical Instrumentation Engineers

Forensic evidence analysis and crime scene investigation : 20-21 November 1996, Boston, Massachusetts

John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.]

(Proceedings / SPIE -- the International Society for Optical Engineering, v. 2941)

SPIE, c1997

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  P63600/2941130960286

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Includes bibliographic references and author index

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  Proceedings

  SPIE -- the International Society for Optical Engineering

  SPIE -- the International Society for Optical Engineering