Text ( visual ) : unmediated Proceedings : 15th Asian Test Symposium : Fukuoka, Japan, November 20-23, 2006. -- Los Alamitos, Calif. : IEEE Computer Society , c2006. -- xxiii, 451 p. : ill. ; 28 cm. -- IEEE Computer Society Order Number P2628 ; "IEEE Computer Society Test Technology Council"--Cover ; Includes bibliographical references. -- ISBN 9780769526287 ; (BA81900555) ; https://ci.nii.ac.jp/ncid/BA81900555 Other Title(s): ATS 2006. -- Author Heading(s): Asian Test Symposium ; IEEE Computer Society ; IEEE Computer Society. Test Technology Technical Council