@book{ BA78343778,
 author = "International Symposium on the Physical & Failure Analysis of Integrated Circuits and Tung, Chih-Hang and IEEE Reliability/CPMT/ED Singapore Chapter and IEEE Electron Devices Society and Centre for IC Failure Anlaysis & Reliability (CICFAR) and National University of Singapore",
 title = "Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]",
 publisher = "IEEE",
 year = "2005",
 URL = "https://ci.nii.ac.jp/ncid/BA78343778"
}
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