Text ( visual ) : unmediated
Proceedings 14th Asian Test Symposium, Calcutta, India, December 18-21, 2005. -- Los Alamitos, Calif. : IEEE Computer Society , c2005. -- xxxv, 476 p. : ill. ; 28 cm. -- IEEE Computer Society Order Number P2481 ; "IEEE Computer society Test Technology Technical Council"--Cover ; Includes bibliographical references. -- ISBN 0769524818 ; (BA77304056) ; https://ci.nii.ac.jp/ncid/BA77304056
Other Title(s): ATS 2005 ; Asian Test Symposium (ATS 2005). -- Author Heading(s): Asian Test Symposium ; IEEE Computer Society ; IEEE Computer Society. Test Technology Technical Council. -- Subject Heading(s): LCSH : Electronic digital computers -- Circuits -- Testing -- Congresses ; LCSH : Electronic circuits -- Testing -- Congresses ; LCSH : Integrated circuits -- Testing -- Congresses ; LCSH : Fault-tolerant computing -- Congresses
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