Electron microscopy and analysis 2003 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003

書誌事項

Electron microscopy and analysis 2003 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003

edited by Stephen McVitie and David McComb

(Institute of Physics conference series, no. 179)

Institute of Physics, c2004

大学図書館所蔵 件 / 全4件

この図書・雑誌をさがす

注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.

目次

Plenary Lectures Functional Materials and Biomaterials New Instrumentation Imaging Theory Theory of Microscopy and Spectroscopy Structural Materials Advances in Nanoanalysis Advances in Imaging Sample Preparation and Nanofabrication Surfaces and Interfaces Nanomaterials Author Index Subject Index

「Nielsen BookData」 より

関連文献: 1件中  1-1を表示

詳細情報

  • NII書誌ID(NCID)
    BA67185609
  • ISBN
    • 0750309679
  • 出版国コード
    uk
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Bristol
  • ページ数/冊数
    xiv, 492 p.
  • 大きさ
    24 cm
  • 分類
  • 件名
  • 親書誌ID
ページトップへ

AltStyle によって変換されたページ (->オリジナル) /