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18th annual proceedings : Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. -- New York, N.Y. : Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers , c1980. -- vii, 339 p. : ill., ports. ; 28 cm. -- "1980 International Reliability Physics Symposium"--T.p. verso ; General chairman: G.T. Cheney ; "IEEE catalog no. 80CH1531-3." ; "Libray of Congress Catalog Card no. 79-92901." ; Includes bibliographical references. -- (BA65962314) ; https://ci.nii.ac.jp/ncid/BA65962314
Other Title(s): Reliability Physics, 18th Annual proceedings 1980. -- Author Heading(s): International Reliability Physics Symposium ; IEEE Electron Devices Society ; IEEE Reliability Society. -- Subject Heading(s): LCSH : Electronic apparatus and appliances -- Reliability Congresses ; LCSH : Electronic apparatus and appliances -- Testing Congresses ; LCSH : Integrated circuits -- Reliability Congresses ; LCSH : Integrated circuits -- Testing Congresses
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