著者名 書名 版表示 出版者名 出版年 シリーズ名 番号 ISBN ISSN URL International Reliability Physics Symposium and IEEE Electron Devices Society and IEEE Reliability Society 18th annual proceedings : Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980 Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers 1980 https://ci.nii.ac.jp/ncid/BA65962314