TY - BOOK
AU - International Reliability Physics Symposium
AU - IEEE Electron Devices Society
AU - IEEE Reliability Society
TI - 18th annual proceedings : Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980
PB - Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers
PY - 1980
EP - vii, 339 p.
UR - https://ci.nii.ac.jp/ncid/BA65962314
ER -
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