%A International Reliability Physics Symposium
%A IEEE Electron Devices Society
%A IEEE Reliability Society
%T 18th annual proceedings : Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980
%I Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers
%D 1980
%U https://ci.nii.ac.jp/ncid/BA65962314
</div><div class="naked_ctrl">
<form action="/index.cgi/contrast" method="get" name="gate">
<p><a href="http://altstyle.alfasado.net">AltStyle</a> によって変換されたページ <a href="https://ci.nii.ac.jp:443/ncid/BA65962314.bix">(-&gt;オリジナル)</a>
/ <label>アドレス: <input type="text" name="naked_post_url" value="https://ci.nii.ac.jp:443/ncid/BA65962314.bix" size="22" /></label> <label>モード: <select name="naked_post_mode">
<option value="default">デフォルト</option>
<option value="speech">音声ブラウザ</option>
<option value="ruby">ルビ付き</option>
<option value="contrast" selected="selected">配色反転</option>
<option value="larger-text">文字拡大</option>
<option value="mobile">モバイル</option>
</select>
<input type="submit" value="表示" />
</p>
</form>
</div>