Text ( visual ) : unmediated
Proceedings : International Test Conference 2003 / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]. -- Washington, D.C. : International Test Conference , c2003. -- xvi, 1334 p. : ill. ; 28 cm. -- IEEE Catalog Number: 03CH37494 ; Includes bibliographical references and index ; 子書誌あり. -- ISBN 0780381068 ; (BA6540053X) ; https://ci.nii.ac.jp/ncid/BA6540053X
Other Title(s): International Test Conference 2003 : Proceedings : September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA. -- Author Heading(s): International Test Conference ; IEEE Computer Society. Test Technology Technical Council ; Institute of Electrical and Electronics Engineers. Philadelphia Section
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