TY - BOOK
AU - International Test Conference
AU - IEEE Computer Society. Test Technology Technical Council
AU - Institute of Electrical and Electronics Engineers. Philadelphia Section
TI - Proceedings : International Test Conference 2003
PB - International Test Conference
PY - 2003
EP - xvi, 1334 p.
UR - https://ci.nii.ac.jp/ncid/BA6540053X
SN - 0780381068
ER -
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