Text ( visual ) : unmediated
2003 IEEE International Reliability Physics Symposium proceedings : 41st annual, Dallas, Texas, March 30-Apri 4, 2003 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society. -- : soft.. -- Piscataway, N.J. : Institute of Electrical and Electronics Engineers , c2002 , c2003. -- x, 645 p. : ill. ; 28 cm. -- Includes bibliographical references ; "IEEE Catalog No. 03CH37400" -- T. p.. -- ISBN 0780376498 ; (BA6271753X) ; https://ci.nii.ac.jp/ncid/BA6271753X
Other Title(s): 03CH37400. -- Author Heading(s): International Reliability Physics Symposium ; IEEE Electron Devices Society ; IEEE Reliability Society
</div><div class="naked_ctrl">
<form action="/index.cgi/contrast" method="get" name="gate">
<p><a href="http://altstyle.alfasado.net">AltStyle</a> によって変換されたページ <a href="https://ci.nii.ac.jp:443/ncid/BA6271753X.txt">(-&gt;オリジナル)</a>
/ <label>アドレス: <input type="text" name="naked_post_url" value="https://ci.nii.ac.jp:443/ncid/BA6271753X.txt" size="22" /></label> <label>モード: <select name="naked_post_mode">
<option value="default">デフォルト</option>
<option value="speech">音声ブラウザ</option>
<option value="ruby">ルビ付き</option>
<option value="contrast" selected="selected">配色反転</option>
<option value="larger-text">文字拡大</option>
<option value="mobile">モバイル</option>
</select>
<input type="submit" value="表示" />
</p>
</form>
</div>