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Proceedings of the 11th Asian Test Symposium (ATS '02), 18-20 November 2002, Guam, USA / sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with Technical Group on Dependable Computing, IEICE, Special Interest Group on System LSI Design Methodology, IPS Japan. -- Los Alamitos, Calif. : IEEE Computer Society , c2002. -- xxi, 437 p. : ill. ; 28 cm. -- "IEEE Computer Society Order Number PR01825"--T.p. verso ; Includes bibliographical references and index. -- ISBN 0769518257 ; (BA61756208) ; https://ci.nii.ac.jp/ncid/BA61756208
Other Title(s): Proceedings of the eleventh Asian Test Symposium ; ATS '02 ; PR01825. -- Author Heading(s): Asian Test Symposium ; IEEE Computer Society. Test Technology Technical Council ; IEICE. Technical Group on Dependable Computing ; IPS Japan. Special Interest Group on System LSI Design Methodology
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