%A Asian Test Symposium
%A IEEE Computer Society. Test Technology Technical Council
%A IEICE. Technical Group on Dependable Computing
%A IPS Japan. Special Interest Group on System LSI Design Methodology
%T Proceedings of the 11th Asian Test Symposium (ATS '02), 18-20 November 2002, Guam, USA
%I IEEE Computer Society
%D 2002
%U https://ci.nii.ac.jp/ncid/BA61756208
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