@book{ BA61756208,
 author = "Asian Test Symposium and IEEE Computer Society. Test Technology Technical Council and IEICE. Technical Group on Dependable Computing and IPS Japan. Special Interest Group on System LSI Design Methodology",
 title = "Proceedings of the 11th Asian Test Symposium (ATS '02), 18-20 November 2002, Guam, USA",
 publisher = "IEEE Computer Society",
 year = "2002",
 URL = "https://ci.nii.ac.jp/ncid/BA61756208"
}
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