@book{ BA54688312,
 author = "Asian Test Symposium and IEEE Computer Society. Test Technology Technical Council and Technical Group on Fault Tolerant Systems",
 title = "Proceedings : 10th Asian Test Symposium, 19-21 November 2001, Kyoto, Japan",
 publisher = "IEEE Computer Society",
 year = "2001",
 URL = "https://ci.nii.ac.jp/ncid/BA54688312"
}
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