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Scattering and surface roughness III : 1-2 August 2000, San Diego, USA / Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. -- Bellingham, Wash. : SPIE , c2000. -- vii, 222 p. : ill. ; 28 cm. -- (Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4100). -- Includes bibliographical references and index. -- ISBN 081943745X ; (BA54588318) ; https://ci.nii.ac.jp/ncid/BA54588318
Author Heading(s): Gu, Zu-Han ; Maradudin, A. A. ; Society of Photo-optical Instrumentation Engineers. -- Classification(s): LCC : TA418.7 ; DC21 : 620/.44. -- Subject Heading(s): LCSH : Surface roughness -- Measurement Congresses ; LCSH : Light -- Scattering Congresses ; LCSH : Electromagnetic waves -- Scattering Congresses
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