Proceedings of the Ninth Asian Test Symposium (ATS 2000), December 4-6, 2000, Taipei, Taiwan

書誌事項

Proceedings of the Ninth Asian Test Symposium (ATS 2000), December 4-6, 2000, Taipei, Taiwan

sponsored by IEEE Computer Society Test Technology Technical Council ; Co-Sponsored by National Cheng-Kung University

IEEE Computer Society Press, c2000

  • :case
タイトル別名

PR00887

ATS 2000

Proceedings of the ninth Asian Test Symposium

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注記

"IEEE Computer Society Order Number PR00887"

Includes bibliographies and index

内容説明・目次

内容説明

These conference proceedings cover such topics as: analogue and mixed signal tests; memory built-in self-test and self-diagnosis; fault simulation and timing simulation; fault analysis; test generation; functional testing; and memory testing.

目次

  • Analog and Mixed Signal Test
  • Memory Built-In Self-Test and Self-Diagnosis
  • Fault Simulation & Timing Simulation
  • Fault Analysis
  • Test Generation
  • Functional Testing
  • Built-In Self-Test
  • Software Testing and Test Synthesis
  • Embedded-Core Testing
  • Memory Testing
  • IDDQ Testing
  • Testability Analysis and Design for Testability
  • Fault Tolerance
  • Low-Power Testing
  • Self-Checking Circuits

「Nielsen BookData」 より

詳細情報

  • NII書誌ID(NCID)
    BA51155369
  • ISBN
    • 0769508871
    • 076950888X
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Los Alamitos, Calif.
  • ページ数/冊数
    xxiii, 495 p.
  • 大きさ
    28 cm
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