Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

• • International Symposium on the Physical & Failure Analysis of Integrated Circuits
• • Chim, Wai Kin
• • Radhakrishnan, M. K.
• • Thong, John T. L.
• • IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• • IEEE Electron Devices Society
• • National University of Singapore. Centre for IC Failure Analysis and Reliability
• • Institute of Microelectronics

• • International Symposium on the Physical & Failure Analysis of Integrated Circuits
• • Chim, Wai Kin
• • Radhakrishnan, M. K.
• • Thong, John T. L.
• • IEEE Singapore Section. Reliability/CPMT/EDA Chapter
• • IEEE Electron Devices Society
• • National University of Singapore. Centre for IC Failure Analysis and Reliability
• • Institute of Microelectronics

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits

edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore

Institute of Electrical and Electronics Engineers, c1999

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タイトル別名

99TH8394

7th International Symposium on th Physical & Failure Analysis of Integrated Circuits 1999

IPFA '99

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• 東京科学大学 大岡山図書館

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"IEEE catalog number 99TH8394"--T.p. verso

"5-9 July, 1999, Orchard Hotel, Singapore"--Cover

Includes bibliographical references and index

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