Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore
Institute of Electrical and Electronics Engineers, c1999
99TH8394
7th International Symposium on th Physical & Failure Analysis of Integrated Circuits 1999
IPFA '99
"IEEE catalog number 99TH8394"--T.p. verso
"5-9 July, 1999, Orchard Hotel, Singapore"--Cover
Includes bibliographical references and index
内容説明
「Nielsen BookData」 より