Text ( visual ) : unmediated 1999 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference, August 30-September 2, 1999 : test technology for the new millennium / sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Central Texas Section. -- : soft. ; : case.. -- Piscataway, NJ : IEEE Service Center , c1999. -- xxix, 830 p. : ill. ; 28 cm. -- "IEEE catalog no. 99CH36323". -- ISBN 078035432X ; 0780354338 ; (BA45434437) ; https://ci.nii.ac.jp/ncid/BA45434437 Other Title(s): 1999 IEEE AUTOTESTCON ; AUTOTESTCON 99 ; 99CH36323. -- Author Heading(s): Autotestcon ; IEEE Aerospace and Electronic Systems Society ; IEEE Instrumentation and Measurement Society ; Institute of Electrical and Electronics Engineers. Central Texas Section. -- Classification(s): LCC : TK7895.A8 ; DC20 : 620/.0044. -- Subject Heading(s): LCSH : Automatic checkout equipment -- Congresses ; LCSH : Electronics in aeronatics -- Congresses ; LCSH : Maintainabillty (Engineering) -- Congresses

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