@book{ BA45434437,
 author = "Autotestcon and IEEE Aerospace and Electronic Systems Society and IEEE Instrumentation and Measurement Society and Institute of Electrical and Electronics Engineers. Central Texas Section",
 title = "1999 IEEE AUTOTESTCON proceedings, IEEE Systems Readiness Technology Conference, August 30-September 2, 1999 : test technology for the new millennium",
 publisher = "IEEE Service Center",
 year = "1999",
 URL = "https://ci.nii.ac.jp/ncid/BA45434437"
}
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