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Digest of papers, IEEE International Workshop on IDDQ Testing : November 5-6, 1997, Washington, D.C. / edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology. -- Los Alamitos, Calif. : IEEE Computer Society Press , c1997. -- ix, 119 p. : ill. ; 28 cm. -- "IEEE Computer Society order number PR08123"--T.p. verso ; "IEEE order plan catalog number 97TB100169"--T.p. verso ; Includes bibliographic references and index. -- ISBN 0818681233 ; (BA43487068) ; https://ci.nii.ac.jp/ncid/BA43487068
Other Title(s): IDDQ testing ; 97TB100169. -- Author Heading(s): IEEE International Workshop on IDDQ Testing ; Jayasumana, Anura P. ; IEEE Computer Society. Technical Committee on Test Technology. -- Classification(s): LCC : TK7871.99.M44 ; DC21 : 621.39/5/0287. -- Subject Heading(s): LCSH : Iddq testing -- Congresses ; LCSH : Metal oxide semiconductors, Complementary -- Testing -- Congresses
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