Nanoscience and technology

• • Klitzing, K. von
• • Wiesendanger, R. (Roland)

• 関連文献: 92件

• • Klitzing, K. von
• • Wiesendanger, R. (Roland)

Nanoscience and technology

Springer, c1998-

• WorldCat

Series editor: K[laus] von Klitzing, R[oland] Wiesendanger

関連文献: 92件中  61-80を表示

• 61

  Lateral alignment of epitaxial quantum dots

  Oliver G. Schmidt, [editor]

  Springer c2007 Nanoscience and technology

  所蔵館7館

• 62

  Roadmap of scanning probe microscopy

  S. Morita (ed.)

  Springer c2007 Nanoscience and technology

  所蔵館5館

• 63

  Nanostructures - Fabrication and Analysis

  Hitoshi Nejo(ed.)

  Springer Berlin 2007 Nanoscience and technology

  所蔵館4館

• 64

  Fundamentals of friction and wear

  Enrico Gnecco, Ernst Meyer

  Springer c2007 Nanoscience and technology

  所蔵館10館

• 65

  Nanocatalysis

  U. Heiz, U. Landman (eds.)

  Springer c2007 Nanoscience and technology

  : pbk

  所蔵館12館

• 66

  Characterization

  Bharat Bhushan, Satoshi Kawata (eds.)

  Springer c2007 Nanoscience and technology . Applied scanning probe methods ; 6

  : pbk

  所蔵館8館

• 67

  Biomimetics and industrial applications

  Bharat Bhushan, Harald Fuchs (eds.)

  Springer c2007 Nanoscience and technology . Applied scanning probe methods ; 7

  所蔵館7館

• 68

  Scanning probe microscopy techniques

  Bharat Bhushan, Harald Fuchs, Satoshi Kawata (eds.)

  Springer c2007 Nanoscience and technology . Applied scanning probe methods ; 5

  所蔵館7館

• 69

  Industrial applications

  Bharat Bhushan, Harald Fuchs (eds.)

  Springer c2006 Nanoscience and technology . Applied scanning probe methods ; 4

  所蔵館5館

• 70

  Characterization

  Bharat Bhushan, Harald Fuchs (eds.)

  Springer c2006 Nanoscience and technology . Applied scanning probe methods ; 3

  所蔵館8館

• 71

  Scanning probe microscopy techniques

  Bharat Bhushan, Harald Fuchs (eds.)

  Springer c2006 Nanoscience and technology . Applied scanning probe methods ; 2

  所蔵館8館

• 72

  Single molecule chemistry and physics : an introduction

  C. Wang, C. Bai

  Springer c2006 Nanoscience and technology

  所蔵館9館

• 73

  Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces

  G. Kaupp

  Springer c2006 Nanoscience and technology

  : pbk

  所蔵館9館

• 74

  Scanning probe microscopy : atomic scale engineering by forces and currents

  A. Foster, W. Hofer

  Springer c2006 Nanoscience and technology

  所蔵館8館

• 75

  Silicon quantum integrated circuits : silicon-germanium heterostructure devices : basics and realisations

  E. Kasper, D.J. Paul

  Springer c2005 Nanoscience and technology

  所蔵館1館

• 76

  Applied physics of carbon nanotubes : fundamentals of theory, optics and transport devices

  S.V. Rotkin, S. Subramoney (eds.)

  Springer c2005 Nanoscience and technology

  所蔵館20館

• 77

  Magnetic microscopy of nanostructures

  H. Hopster, P. Oepen (eds.)

  Springer c2005 Nanoscience and technology

  所蔵館11館

• 78

  Nanostructures : theory and modeling

  C. Delerue, M. Lannoo

  Springer c2004 Nanoscience and technology

  所蔵館11館

• 79

  Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach

  M. Alexe, A. Gruverman, Eds

  Springer c2004 Nanoscience and technology

  所蔵館9館

• 80

  Applied scanning probe methods

  Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.]

  Springer c2004 Nanoscience and technology

  所蔵館20館

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