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Proceedings of the Fourth Asian Test Symposium, November 23-24, 1995, Bangalore, India / sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI). -- Los Alamitos, CA : IEEE Computer Society Press , c1995. -- xiv, 394 p. : ill. ; 28 cm. -- "IEEE order plan catalog number 95CS8084" ; Includes bibliographies and index. -- ISBN 0818671297 ; (BA28737432) ; https://ci.nii.ac.jp/ncid/BA28737432
Other Title(s): 95CS8084. -- Author Heading(s): Asian Test Symposium ; IEEE Computer Society. Technical Committee on Test Technology ; VLSI Society of India. -- Classification(s): LCC : TK7874 ; DC20 : 621.381/548. -- Subject Heading(s): LCSH : Integrated circuits -- Testing -- Congresses ; LCSH : Automatic test equipment -- Congresses
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