書誌事項

Atom probe field ion microscopy

M.K. Miller ... [et al.]

(Monographs on the physics and chemistry of materials, 52)(Oxford science publications)

Clarendon Press, 1996

この図書・雑誌をさがす

注記

Includes references

内容説明・目次

内容説明

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

目次

  • 1. Historical background and general introduction
  • 2. Physical principles of field ion microscopy
  • 3. FIM image interpretation and application
  • 4. Physical principles of atom probe interpretation
  • 5. Statistical analysis of atom probe data
  • 6. Metallurgical applications
  • 7. Atom probe studies of non-metallic materials, thin films and surface phenomena
  • Epilogue: future directions

「Nielsen BookData」 より

関連文献: 2件中  1-2を表示

詳細情報

ページトップへ

AltStyle によって変換されたページ (->オリジナル) /