Text ( visual ) : unmediated 13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings / sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section. -- pbk.. -- Los Alamitos, Calif. : IEEE Computer Society Press , c1995. -- xx, 493 p. : ill. ; 28 cm. -- Includes bibliographical references and index. -- ISBN 0818670002 ; (BA25972389) ; https://ci.nii.ac.jp/ncid/BA25972389 Other Title(s): Thirteenth IEEE VLSI Test Symposium. -- Author Heading(s): IEEE VLSI Test Symposium ; IEEE Computer Society. Technical Committee on Test Technology ; Institute of Electrical and Electronics Engineers. Philadelphia Section. -- Classification(s): LCC : TK7874 ; DC20 : 621.39/5/0287. -- Subject Heading(s): LCSH : Integrated circuits -- Very large scale integration -- Testing -- Congresses