@book{ BA25972389,
 author = "IEEE VLSI Test Symposium and IEEE Computer Society. Technical Committee on Test Technology and Institute of Electrical and Electronics Engineers. Philadelphia Section",
 title = "13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey : proceedings",
 publisher = "IEEE Computer Society Press",
 year = "1995",
 URL = "https://ci.nii.ac.jp/ncid/BA25972389"
}
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