Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California
cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 525)
SPIE--the International Society for Optical Engineering, c1985
Includes bibliographies and index
SPIE -- the International Society for Optical Engineering
SPIE -- the International Society for Optical Engineering