Proceedings of the 1994 Second CAD-Based Vision Workshop, February 8-11, 1994, Champion, Pennsylvania
edited by A.C. Kak, K. Ikeuchi ; sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence
IEEE Computer Society Press, c1994
94TH05959
paper509.6/CA/940001245578,0001762860
Includes bibliographical references and index
IEEE Catalog no.94TH0595-9