Text ( visual ) : unmediated Fundamentals of surface and thin film analysis / Leonard C. Feldman, James W. Mayer. -- Englewood Cliffs, N.J. : Prentice Hall , c1986. -- xviii, 352 p. : ill. ; 24 cm. -- Includes bibliographies and index. -- ISBN 0135005701 ; (BA21751606) ; https://ci.nii.ac.jp/ncid/BA21751606 Author Heading(s): Feldman, Leonard C. ; Mayer, James W.. -- Classification(s): LCC : QD506 ; DC19 : 530.4/1. -- Subject Heading(s): LCSH : Surfaces (Technology) -- Analysis ; LCSH : Thin films -- Analysis