書誌事項

Characterization of materials

volume editor, Eric Lifshin

(Materials science and technology : a comprehensive treatment / edited by R.W. Cahn, P. Haasen, E.J. Kramer, v. 2A, 2B)

VCH, c1992-1994

  • Part 1 : gw
  • Part 1 : us
  • Part 2 : gw
  • Part 2 : us

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注記

Includes bibliographical references and index

内容説明・目次

巻冊次

Part 1 : gw ISBN 9783527268153

内容説明

Characterization is essential to the systematic development of new materials and understanding how they behave in practical applications. Throughout all the volumes of "Materials Science and Technology", the theme of linking properties with microstructure and chemical composition is repeated. Volume 2 focuses on the principal methods required to characterize metal alloys, semiconductors, polymers and ceramics. Modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase. Details of these phases can be very complex and usually vary with processing. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material or fabricated product unique. The challenge to the materials scientist, chemist or engineer is to know what information is needed to fully characterize each material or fabricated product and how to use this information to explain its behaviour, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. Today there are thousands of techniques used to characterize materials. The goal of Volume 2, which will be published in two parts, is to provide an introductory understanding of a number of the most important techniques. Each is described in sufficient detail so that the reader will develop an awareness of the instrumentation used, how it works, what kind of information it provides, and what are its limitations. Volume 2A concentrates on microscopic techniques that span a range of magnifications from that of the low magnification available with light optical microscopy, through scanning electron microscopy and finally to the very high resolution of transmission electron microscopy. Volume 2B adds to the methods described in 2A.

目次

  • Electron diffraction and transmission electron microscopy, Amelinckx
  • analytical electron microscopy, Hall
  • scanning electron microscopy, Joy
  • X-ray diffraction, Snyder
  • light optical microscopy, Petzow and Telle
  • atomic spectroscopy, Skelly, Frame and Keliher
  • thermoanalytical methods, Gallagher
  • applications of sysnchroton X-ray radation to materials science, Halfpenny et al
  • X-ray fluorescence analysis, Jenkins
  • polymer molecular structure determination, Williams.
巻冊次

Part 2 : gw ISBN 9783527282654

内容説明

A handbook, covering the field of materials science and technology, which considers both academic and industrial aspects. The detailed index makes the information in this reference text easily accessible. Every article also contains a list of symbols.

目次

Scanning Tunneling Microscopy Mechanical Spectroscopy Auger Electron Microscopy Quantitative Acoustic Microscopy Quantitative Analysis of Microstructure Electron Microprobe Analysis of Microstructure Electron Microprobe Analysis High Energy Ion Beam Analysis Techniques Field Ion Microscopy and the Position Sensitive Atom Probe Neutron Diffraction Small-Angle Scattering of X-Rays and Neutrons.

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詳細情報

  • NII書誌ID(NCID)
    BA18471838
  • ISBN
    • 3527268154
    • 089573690X
    • 3527282653
    • 1560811285
  • 出版国コード
    gw
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Weinheim, FDR ; New York
  • ページ数/冊数
    2 v.
  • 大きさ
    25 cm
  • 分類
  • 件名
  • 親書誌ID
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