editor, Gregory J. Exarhos

Momentum Press 2010 Materials characterization series : surfaces, interfaces, thin films / series editors, C. Richard Brundle, Charles A. Evans, Jr.

: hbk. : case bound

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editors, Gregory J. Exarhos ... [et al.] ; organized and published by SPIE ; cosponsored by Lawrence Livermore National Laboratory (USA) ; cooperating organizations, Center for High Technology Materials at the University of New Mexico (USA) ... [et al.]

SPIE c2008 Proceedings / SPIE -- the International Society for Optical Engineering v. 6720

pbk.

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editor, Gregory J. Exarhos ; managing editor, Lee E. Fitzpatrick

Butterworth-Heinemann , Manning c1993 Materials characterization series

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