Single Event Effects Testing of the Intel Pentium III (P3) Microprocessor

Thirteenth Biennial Single Effects Symposium
Manhattan Beach, CA, April, 2002

James W. Howard Jr.: Jackson and Tull Chartered Engineers
Martin A. Carts, Ronald Stattel, Charles E. Rogers: Raytheon/ITSS
Timothy L. Irwin, QSS Group, Inc.
Kenneth A. LaBel, NASA/GSFC Code 561

howard_see_symp02_with_notes.pdf
howard_see_symp02.pdf
howard_see_symp02.ppt Summary
Extensive data has been collected on the total dose and single event response of the Intel Pentium III.The data indicates that there is a high tolerance to total dose and there is no susceptibility to latchup from protons and heavy ions to an LET of approximately 15 MeV-cm 2 /mg.Single event upsets and functional interrupts are present.However,for the Pentium III,if running with the caches disabled is an option and with mitigation in place,these events may be controllable to allow for operation in the space environment. The thermal issues and the power requirements of these processors will most likely be the limiting factors in their usage in space applications.

(May 7, 2002) The .ppt file has explanatory text in the notes field.

Single Event Upset Characterization of the Pentium 4, Pentium III and Low Power Pentium MMX Microprocessors using Proton Irradiation

D. Hiemstra, S. Yu, M. Pop, MDRobotics

Presented at the 2002 IEEE NSREC
Phoenix, AZ

Abstract
Experimental single event upset characterization of the Pentium 4, Pentium III and Low power Pentium MMX microprocessors using proton irradiation is presented. Results are compared with previous tests on other Pentium microprocessors.

Single Event Effect Test Report on the Intel 80386 Microprocessor, 80387 Coprocessor, and 82380 Integrated Peripheral

b022196.htm
tested 2/20-21/96

Preliminary Draft Heavy Ion SEU Results on 80486 Microprocessors

b051397a.htm tested 5/13-16/97

Single Event Effect Proton and Heavy Ion Test Results in Support of Candidate NASA Programs

ieee95a.htm

Single Event Effect Testing of the Intel 80386 Family and the 80486 Microprocessor

intel.htm

Single Event Effect and Radiation Damage Results for Candidate Spacecraft Electronics

nsrec98.pdf

Current Single Event Effect Test Results for Candidate Spacecraft Electronics

random6a.htm

Total Dose Test Report on the Intel 80486DX2-66 Microprocessor

td80486.htm Tested 8/29-9/8/95

Radiation Report on TRMM/GPEP Part No. MQ80386-20

ppm-93-062.pdf Summary
All five parts passed initial (pre-rad) electrical tests. All four irradiated parts passed all electrical tests at each irradiation level up to and including the 5 krad(Si) irradiation. After the 7.5 krad(Si) irradiation, all four irradiated parts failed all four functional tests and a number of V_OH and V_OL tests. All parts continued to fail all four functional tests and a number of V_OH and V_OL tests throughout all subsequent annealing steps.