The Working Group uses a reflector at STDS-1450@LISTSERV.IEEE.ORG. You may join the group and stay current on STIL topics by sending an email to STDS-1450@LISTSERV.IEEE.ORG, and in the body of the email state: subscribe stds-1450.
The original STIL effort (now known as IEEE Std. 1450.0-1999) was purposefully scoped to expand. There are currently seven additional standards projects in the STIL effort. The Individual Activities below identifies these projects.
And welcome to STIL! (that's style)
Quick Links: xCurrent Status/Overview xIndividual Activities xCalendar xMinutes of Overview Meetings
A summary of the intent, purpose, and current directions of the activities associated with IEEE 1450.
IEEE Std 1450-1999 is available from the IEEE Standards Association. The standard can be found under the Test Technology Standards reference. In addition, a Representative BNF for IEEE Std 1450-1999 (PDF format) is available here. This BNF was generated with the goal of providing a simplified introduction to STIL. As such, it is an incomplete representation of the language, and the Standard Document must be used to completely specify the language. Still, this serves to orient newcomers to the constructs of STIL. Also, the Clarifications for IEEE Std 1450-1999 (PDF format) is available here. This document is maintained by the STIL Working Group and is updated on an as-needed basis.
A series of dotted extension projects have been created to address issues identified to be outside the scope of the initial project. See the table below for information about each effort effort.
1450 Individual Working Group Activities
Website
Title
Documents
Contact
Status
Standard Test Interface Language (STIL) for Digital Test Vectors
PAR (txt);
Partial BNF (pdf);
Clarifications (pdf);
Published August 1999
Extensions to STIL for Semiconductor Design Environments
PAR (pdf)
extension request (doc)
approval (txt)
Published - June 2005
Extensions to STIL for Tester Target Specification
PAR (pdf)
extension 1 (to dec 12, 2005)
extension 2 (to dec 12, 2006)
Published - September 2007
Extensions to STIL for Test Flow Specification
Original PAR (pdf)
Second PAR (pdf) and approval letter – valid from 29-Mar-2004 to 31-Dec-2008
PAR expired 12-Dec-2008; was administratively withdrawn by IEEE at the 7-Dec-2010 NESCOM meeting.
Restarted PAR granted 8-Jun-2012, valid through 31-Dec-2016
Current PAR Extension granted through 31-Dec- 2017
Approved – Dec. 5, 2017
Published - Feb. 9, 2018
Extensions to STIL for Semiconductor Test Method Specification
PAR (pdf)
PAR dropped, will be re-started after completion of P1450.4
Extensions to STIL for Core Test Language (CTL) Support
PAR (html)
Approved – 2005
Published - November 2005
Extensions to STIL for Analog and Mixed Signal
PAR being created
Extensions to STIL for Design Information - path delay, physical layoute, more ...
Al Crouch
Paul Reuter
Proposal by Al Crouch
Maintained by Greg Maston/Jim O'Reilly